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Impact of slot/pole combination on inter-turn short-circuit current in fault-tolerant permanent magnet machines

机译:容错永磁电机中缝隙/极组合对匝间短路电流的影响

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摘要

This paper investigates the influence of the slot/pole (S/P) combination on inter-turn short-circuit (SC) current in fault-tolerant permanent magnet (FT-PM) machines. A 2-D sub-domain field computational model with multi-objective genetic algorithm is used for the design and performance prediction of the considered FT-PM machines. The electromagnetic losses of machines, including iron, magnet, and winding losses are systematically computed using analytical tools. During the postprocessing stage, a 1-D analysis is employed for turn-turn fault analysis. The method calculates self-and mutual inductances of both the faulty and healthy turns under an SC fault condition with respect to the fault locations, and thus SC fault current, considering its location. Eight FT-PM machines with different S/P combinations are analyzed. Both the performance of the machine during normal operation and induced currents during a turn-turn SC fault are investigated. To evaluate the thermal impact of each S/P combination under an inter-turn fault condition, a thermal analysis is performed using finite element computation. It is shown that low-rotor-pole-number machines have a better fault tolerance capability, while high-rotor-pole-number machines are lighter and provide higher efficiency. Results show that the influence of the S/P selection on inter-turn fault SC current needs to be considered during the design process to balance the efficiency and power density against fault-tolerant criteria of the application at hand.
机译:本文研究了容错永磁体(FT-PM)电机中缝隙/磁极(S / P)组合对匝间短路(SC)电流的影响。具有多目标遗传算法的二维子域场计算模型用于所考虑的FT-PM机器的设计和性能预测。使用分析工具可以系统地计算出机器的电磁损耗,包括铁,磁体和绕组的损耗。在后处理阶段,将一维分析用于转弯故障分析。该方法计算相对于故障位置的SC故障条件下的故障匝数和正常匝数的自感和互感,从而计算SC故障电流(考虑其位置)。分析了八台具有不同S / P组合的FT-PM机器。研究了正常运行期间的机器性能以及转弯SC故障期间的感应电流。为了评估在匝间故障条件下每个S / P组合的热影响,使用有限元计算进行热分析。结果表明,低转子极数的机器具有更好的容错能力,而高转子极数的机器更轻,效率更高。结果表明,在设计过程中需要考虑S / P选择对匝间故障SC电流的影响,以平衡效率和功率密度与当前应用的容错标准。

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